Título: | METALLIC NANOSTRUCTURE FABRICATION BY AFM LITHOGRAPHY | |||||||
Autor: |
HENRIQUE DUARTE DA FONSECA FILHO |
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Colaborador(es): |
RODRIGO PRIOLI MENEZES - Orientador MARCOS HENRIQUE DE PINHO MAURICIO - Coorientador |
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Catalogação: | 14/MAR/2005 | Língua(s): | PORTUGUESE - BRAZIL |
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Tipo: | TEXT | Subtipo: | THESIS | |||||
Notas: |
[pt] Todos os dados constantes dos documentos são de inteira responsabilidade de seus autores. Os dados utilizados nas descrições dos documentos estão em conformidade com os sistemas da administração da PUC-Rio. [en] All data contained in the documents are the sole responsibility of the authors. The data used in the descriptions of the documents are in conformity with the systems of the administration of PUC-Rio. |
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Referência(s): |
[pt] https://www.maxwell.vrac.puc-rio.br/projetosEspeciais/ETDs/consultas/conteudo.php?strSecao=resultado&nrSeq=6061&idi=1 [en] https://www.maxwell.vrac.puc-rio.br/projetosEspeciais/ETDs/consultas/conteudo.php?strSecao=resultado&nrSeq=6061&idi=2 |
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DOI: | https://doi.org/10.17771/PUCRio.acad.6061 | |||||||
Resumo: | ||||||||
In this dissertation, we have developed a lithography
process based on the
atomic force microscopy of technique. The study of the
lithography process starts
with the deposition and characterization of amorphous
arsenic sulfide thin films
(a-As2S3) in silicon substrates and the deposition of a
metallic aluminum layer,
used as mask, on the surface of the a-As2S3. An atomic
force microscope was used
to write patterns in a controlled way on the metallic
layer. Therefore, the influence
of microscope feedback system on the accomplishment of the
lithography was
analyzed. In order to transfer the lithographed pattern to
a silicon substrate, the a-
As2S3 was exposed to a UV light source and was dissolved
with a K2CO3 solution.
Then, a thin gold layer was deposited by sputtering DC,
and a new dissolution,
now with NaOH was performed, leading to the deposition of
Au nanostructures
onto the silicon substrate.
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