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Título: QUARTZ CRYSTAL OSCILLATORS AS ATOMIC FORCE MICROSCOPE SENSORS
Autor: FELIPE PTAK LEMOS
Colaborador(es): RODRIGO PRIOLI MENEZES - Orientador
Catalogação: 13/OUT/2016 Língua(s): PORTUGUESE - BRAZIL
Tipo: TEXT Subtipo: THESIS
Notas: [pt] Todos os dados constantes dos documentos são de inteira responsabilidade de seus autores. Os dados utilizados nas descrições dos documentos estão em conformidade com os sistemas da administração da PUC-Rio.
[en] All data contained in the documents are the sole responsibility of the authors. The data used in the descriptions of the documents are in conformity with the systems of the administration of PUC-Rio.
Referência(s): [pt] https://www.maxwell.vrac.puc-rio.br/projetosEspeciais/ETDs/consultas/conteudo.php?strSecao=resultado&nrSeq=27637&idi=1
[en] https://www.maxwell.vrac.puc-rio.br/projetosEspeciais/ETDs/consultas/conteudo.php?strSecao=resultado&nrSeq=27637&idi=2
DOI: https://doi.org/10.17771/PUCRio.acad.27637
Resumo:
The characterization of quartz tuning forks (QTF) was performed in this dissertation, aiming to implement them as sensors at an atomic force microscope (AFM). The QTF has several advantages over traditional silicon cantilevers. Used in dynamic AFM modes, the QTF has higher quality factor and stiffness, allowing better force sensitivity and lower amplitudes of oscillation for imaging than traditional cantilevers. In this work, electrical and mechanical parameters of the QTF were obtained. Furthermore, a study of the influence of additional mass on the QTF prongs was performed. To implement the QTF at the AFM, a feedback system composed of a lock–in amplifier and a differential amplifier was developed and tested. Additionally, a new microscope head was designed to adapt the QTF to the microscope.
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