This dissertation proposed the development of a quantification method, by microscopy, of the microconstituent Martensite-Austenite (MA) in a High Strength Low Alloy (HSLA) steel of the API5LX80 class. Images were obtained by Optical Microscopy (OM) and Scanning Electron Microscopy (SEM), in secondary electron (SE) and backscattered electron (BSE) modes. Digital Image Processing and Analysis (IA) was employed to process and quantify the acquired images and compare the results of the two types of microscopy. The main challenge was to discriminate the MA amidst a complex multiphase microstructure with varying fractions of ferrite, bainite and MA itself. To reveal the MA different chemical and electrolytic etching sequences were tested. The results showed that a mixed combination with an extra step of modified LePera etchant issued the best contrast for both OM and BSE mode SEM. SEM images in SE mode showed edge problems due to the location of the electron detector, what prevented the correct discrimination of MA regions. The accelerating voltage in the BSE mode was reduced to 5 kV which in turn decreased beam penetration and increase contrast due to the thin MA layer. These images were filtered to reduce noise and segmented by a simple threshold to quantify MA. In the color OM images MA was segmented by thresholds in the RGB or HSB color spaces and subsequently quantified. Employing Co-Site Microscopy images of identical fields acquired by OM and SEM, a direct comparison of the techniques was allowed. It was show that, for the same magnification, optical microscopy tends to underestimate the MA fraction when compared to electron microscopy in BSE mode.