$$\newcommand{\bra}[1]{\left<#1\right|}\newcommand{\ket}[1]{\left|#1\right>}\newcommand{\bk}[2]{\left<#1\middle|#2\right>}\newcommand{\bke}[3]{\left<#1\middle|#2\middle|#3\right>}$$
X
INFORMAÇÕES SOBRE DIREITOS AUTORAIS


As obras disponibilizadas nesta Biblioteca Digital foram publicadas sob expressa autorização dos respectivos autores, em conformidade com a Lei 9610/98.

A consulta aos textos, permitida por seus respectivos autores, é livre, bem como a impressão de trechos ou de um exemplar completo exclusivamente para uso próprio. Não são permitidas a impressão e a reprodução de obras completas com qualquer outra finalidade que não o uso próprio de quem imprime.

A reprodução de pequenos trechos, na forma de citações em trabalhos de terceiros que não o próprio autor do texto consultado,é permitida, na medida justificada para a compreeensão da citação e mediante a informação, junto à citação, do nome do autor do texto original, bem como da fonte da pesquisa.

A violação de direitos autorais é passível de sanções civis e penais.
Coleção Digital

Avançada


Estatísticas | Formato DC | MARC |



Título: SURFACE PLASMON RESONANCE SPECTROSCOPY FOR THE CHARACTERIZATION OF NANOPARTICLES, ORGANIC THIN FILM AND 2-D MATERIALS
Autor: QUAID ZAMAN
Instituição: PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO - PUC-RIO
Colaborador(es):  TOMMASO DEL ROSSO - ADVISOR
Nº do Conteudo: 46145
Catalogação:  02/12/2019 Idioma(s):  ENGLISH - UNITED STATES
Tipo:  TEXT Subtipo:  THESIS
Natureza:  SCHOLARLY PUBLICATION
Nota:  Todos os dados constantes dos documentos são de inteira responsabilidade de seus autores. Os dados utilizados nas descrições dos documentos estão em conformidade com os sistemas da administração da PUC-Rio.
Referência [pt]:  https://www.maxwell.vrac.puc-rio.br/colecao.php?strSecao=resultado&nrSeq=46145@1
Referência [en]:  https://www.maxwell.vrac.puc-rio.br/colecao.php?strSecao=resultado&nrSeq=46145@2
Referência DOI:  https://doi.org/10.17771/PUCRio.acad.46145

Resumo:
Surface Plasmon Resonance (SPR) Spectroscopy based sensors have emerged as a versatile and widely used optical tool for the label free ultrasensitive detection of gas and (bio) chemical analytes. The sensing mechanism is relying on the sensitivity of the evanescent field of the Surface Plasmon Polariton (SPP) wave propagating at metal dielectric interface, which acts as an efficient optical nanoprobe in the external medium. Despite the excellent results in the real-time sensing applications, SPR Spectroscopy has found limited applications in the accurate ellipsometric characterization of thin films with thickness higher than a few nm. The limitations are mainly associated with the long-time instability of the metal-dielectric interfaces of the SPR devices, which deteriorates the accuracy in the simultaneous determination of thickness and refractive index of the thin films under investigation. For these reasons, the first part of the dissertation is dedicated to the study of the degradation and stabilization process of the metal-organic interfaces of different SPR sensing platforms, in both air and water environment. The sensing platforms were monitored by SPR spectroscopy and atomic force microscopy (AFM). Different metal-dielectric interfaces configurations were analyzed, in terms of both adhesion layers, type of metal supporting the plasma wave and super-layers, with the aim to optimize the stability and the sensitivity of both monomodal and multimodal SPR platforms. The best performances were obtained when a low damping metal-dielectric interface is created through the self-assembling of a monolayer of (3-Mercaptopropyl) trimethoxysilane (MPTS), and a single layer graphene (SLG) is transferred as a super-layer on the gold (Au) thin film. The study of the process of stabilization of the SPR platforms was the base for the development of the second part of the dissertation, where we demonstrate the potentialities of the SPR spectroscopy in the Kreschtmann configuration for the accurate ellipsometric characterization of a class of three different materials: gold nanoparticles (AuNPs), organic luminescent materials, and graphene. To obtain the simultaneous determination of both the thickness and refractive index of the thin films, a two-color and/or two-mode approach was adopted, the latter performed by the use of dielectric loaded waveguides (DLWG) with symmetric Au/MPTS/SiO2 interfaces. Finally, the three class of materials have been used for the development of novel SPR optical sensors with environmental or biological interest. The proof of principle of an SPR based UVA dosimeter is demonstrated via the monitoring of the radiation induced modifications of the thickness and refractive index of luminescent thin film of tris(8-hydroxxyquinoline) (Alq3) and tris(dibenzoylmethnae) mono(1,10-phenanthroline) europium (III) (Eu(dbm)3Phen). Sodium Citrate stabilized AuNPs with a nominal diameter of about 15 nm were used to show the principle work of a two-color SPR spectroscopy nanosizer and nanocounter. In the latter case, we demonstrate experimentally that DLWGs can be used as accurate nanocounters in the range of surface density between 20 and 200 NP/um2, with results important for both optical metrology and the emerging particle amplified PA-SPR spectroscopy. Finally, we show the use of the Au/SLG interface for the ultrasensitive detection of heavy metal ions of environmental interest, with an unprecedented limit of detection (LoD) of the order of part per billion (ppb). The experimental results support the theoretical predictions about the affinity of particular sites of the infinite graphene to heavy metal ions, and the possibility to enhance the sensitivity of SPR devices by the plasmon assisted electron transfer between the metal film and the SLG.

Descrição Arquivo
COMPLETE  PDF
Logo maxwell Agora você pode usar seu login do SAU no Maxwell!!
Fechar Janela



* Esqueceu a senha:
Senha SAU, clique aqui
Senha Maxwell, clique aqui