Surface Plasmon Resonance Spectroscopy (SPR) is an optical technique widely used to monitor the physical or chemical changes occurring at a metal-dielectric interface. The simultaneous measurement of the thickness and the index of refraction of organic thin films adsorbed or deposited on the metal flat surface require two independent measurements following a methodology commonly named in literature as Two-Colors Method or Two-Medium Method. In the first one, the two measurements are performed using different wavelength of the electromagnetic radiation interacting with the sample. In the second one the index of refraction of the external medium (gas, liquid) is changed between the two measurements.While the first method implies the knowledge of the dispersion function of the organic layer, the second one gives accurate results only when the organic molecules don t interact chemically with the external fluid. Both of these methods present difficulties when applied to the characterization of luminescent organic materials, most of the time highly reactive to humidity and to the contact with organic solvents. In this work an automated SPR spectrometer was assembled and first tested on the characterization of home-made samples in terms of the absolute value and homogeneity of the optical constants of the metal deposition supporting the plasma wave. We demonstrate that accurate measurements of such optical constants allow the determination of the index of refraction of thermally evaporated luminescent organic thin films using a Two-Metal Substrate Method. This method, to our knowledge only theorized up to now in literature, has been applied to an encapsulated sample containing a thin film of commercial Alq3. Further, the degradation of the metal/Alq3 interface exposed to air has been real time monitored indicating a progressive drop in the angle of resonance of the sample.